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74F623 데이터시트(PDF) 6 Page - NXP Semiconductors |
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74F623 데이터시트(HTML) 6 Page - NXP Semiconductors |
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6 / 12 page ![]() Philips Semiconductors Product specification 74F620/74F623 Transceivers 1990 Apr 6 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT A0–A7 IO = 3mA ±10%VCC 2.4 V VO High level output voltage B0–B7 VCC = MIN, VIL = MAX IOH = –3mA ±5%VCC 2.7 3.3 V VOH High-level output voltage B0 B7 VIL = MAX, VIH = MIN IO = 15mA ±10%VCC 2.0 V B0–B7 IOH = –15mA ±5%VCC 2.0 V A0 A7 IO = 24mA ±10%VCC 0.35 0.50 V VO Low level output voltage A0–A7 VCC = MIN, VIL = MAX IOL = 24mA ±5%VCC 0.35 0.50 V VOL Low-level output voltage B0 B7 VIL = MAX, VIH = MIN, IOL = 48mA ±10%VCC 0.38 0.55 V B0–B7 IOL = 64mA ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage OEBA, OEAB VCC = 0.0V, VI = 7.0V 100 µA I in ut voltage others VCC = 5.5V, VI = 5.5V 1 mA IIH High-level input current OEBA, OEAB VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current OEAB only VCC = MAX, VI = 0.5V –20 µA IOZH+IIH Off-state output current, High-level of voltage applied A0–A7 VCC = MAX, VI = 2.7V 70 µA IOZL+IIL Off-state output current, Low-level of voltage applied B0–B7 VCC = MAX, VI = 0.5V –70 µA IOS Short-circuit output cur- NO TAG A0–A7 VCC = MAX –60 –150 mA IOS rentNO TAG B0–B7 VCC = MAX –100 –225 mA ICCH OEBA=OEAB=4.5V; A0–A7=GND 70 92 mA 74F620 ICCL VCC = MAX OEBA=OEAB=4.5V; A0–A7=4.5V 84 110 mA ICC Supply current ICCZ OEAB=GND; OEBA=A0–A7=4.5V 84 110 mA ICC y (total) ICCH OEBA=OEAB=4.5V; A0–A7=4.5V 110 140 mA 74F623 ICCL VCC = MAX OEBA=OEAB=4.5V; A0–A7=GND 110 140 mA ICCZ OEAB=GND; OEBA=A0–A7=4.5V 99 130 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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