Philips Semiconductors FAST Products

Product specification

74F8965/74F8966

9-Bit address/data Futurebus transceiver, ADT

December 19, 1990

8

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

MIN

MAX

High–level output current

B0 – B8

100

µA

IAMC (74F8966)

100

µA

Power–off output current

B0 – B8

100

µA

IAMC (74F8966)

100

µA

High-level output voltage

2.4

V

0.50

V

Low-level output voltage

IAMC (74F8966)

0.50

V

B0 – B8

0.75

1.0

1.10

V

Input clamp voltage

-1.2

V

Input current at

maximum input voltage

OEB0, OEB1,

OEA, LE, LS,

IAREQ

100

µA

A0 – A8, B0 –

B8

1

mA

High–level input current

OEB0, OEB1,

OEA, LE, LS,

IAREQ

20

µA

B0 – B8

100

µA

Low–level input current

OEB0, OEB1,

OEA, LE, LS,

IAREQ

–100

µA

B0 – B8

–100

µA

Off–state output current,

high–level voltage applied

A0 – A8

50

µA

Off–state output current,

low–level voltage applied

–50

µA

Short circuit output

A0 – A8 only

AO8

-60

-150

mA

80

140

mA

Supply current (total)

85

145

mA

75

100

mA

Notes to DC electrical characteristics

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

niques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a

high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence