| 전자부품 데이터시트 검색엔진 |
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TS431ACT 데이터시트(PDF) 3 Page - Taiwan Semiconductor Company, Ltd |
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TS431ACT 데이터시트(HTML) 3 Page - Taiwan Semiconductor Company, Ltd |
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3 / 8 page ![]() TS431/A/B 3-8 2003/12 rev. B Electrical Characteristics (continued) (Ta=25 oC, unless otherwise specified.) Note 4. Deviation of reference input voltage, VDEV, is defined as the maximum deviation of the reference over the full temperature range. The average temperature coefficient of the reference input voltage αVref is defined as: | αVref | = [ VDEV / Vref(25 oC) ] * 106 / T2 – T1…………………….. (PPM/ oC) Where: T2-T1 = full temperature change. αVref can be positive or negative depending on whether the slope is positive or negative. Example: Maximum Vref=2.496V at 30 oC, minimum Vref=2.492V at 0oC, Vref=2.495V at 25oC, ∆T=70 oC | αVref | = [ 4mV / 2495mV ] * 106 / 70oC ≈ 23ppm/oC Note 5. The dynamic output impedance, Rz, is defined as: | Zka | = ∆Vka / ∆Ika When the device is programmed with two external resistors R1and R2 (see Figure 2). The dynamic output impedance of the overall circuit, is defined as : | Zka | = ∆v / ∆i | ≈ Zka | * ( 1 + R1 / R2) Test Circuits |
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