IL260 IL261

2

Absolute Maximum Ratings

Parameters

Symbol

Min.

Typ.

Max.

Units

Test Conditions

Storage Temperature

T

S

-55

175

°C

Ambient Operating Temperature

T

A

-55

125

°C

Supply Voltage

V

DD

-0.5

7

V

Input Voltage

V

I

-0.5

V

V

Output Voltage

V

O

-0.5

V

V

Output Current

I

O

-10

10

mA

Drive Channel

Lead Solder Temperature

280

°C

10 s

ESD

2 kV Human Body Model

Recommended Operating Conditions

Parameters

Symbol

Min.

Typ.

Max.

Units

Test Conditions

T

A

-40

85

°C

Supply Voltage

V

DD

3.0

5.5

V

3.3/5.0 V Operation

Supply Voltage

V

DD

4.5

5.5

V

5 V Operation

Logic High Input Voltage

V

IH

2.4

V

DD

mA

Logic Low Input Voltage

V

IL

0

0.8

V

Minimum Input Signal Rise and

Fall Times

t

1

µsec

Insulation Specifications

Parameters

Symbol

Min.

Typ.

Max.

Units

Test Conditions

Creepage Distance (external)

0.15'' SOIC

4.026

mm

0.30'' SOIC

8.077

mm

0.2

µA

RMS

240 V

RMS

Ω || pC

Safety & Approvals

IEC61010-1

TUV Certificate Numbers:

Approval Pending

Classification

Model

Package

Pollution Degree

Material Group

Max. Working

Voltage

IL260, IL261

.30

II

III

IL260-3, IL261-3

.15

II

III

UL 1577

Component Recognition program. File #:

Approval Pending

Electrostatic Discharge Sensitivity

This product has been tested for electrostatic sensitivity to the limits stated in the specifications. However, NVE recommends that all integrated

circuits be handled with appropriate care to avoid damage. Damage caused by inappropriate handling or storage could range from performance

degradation to complete failure.