165RHT datasheet(10/10 Pages) PHILIPS

10 / 10 page

1998 Jan 29

303

Philips Components

Maintenance type

Aluminium electrolytic capacitors

Radial High Temperature

165 RHT

Table 3

Multiplier of ripple current (IR/IRO) as a function of frequency; IRO = ripple current at 100 Hz; see Fig.9

SPECIFIC TESTS AND REQUIREMENTS

General tests and requirements are specified in this handbook, Section

“Tests and Requirements”.

Table 4

Test procedures and requirements

FREQUENCY

(Hz)

IR MULTIPLIER

UR =10to25V

UR =35or40V

UR =50V

0.85

0.80

0.75

100

1.00

300

1.20

1.25

1.30

1000

1.30

1.40

1.50

3000

1.35

1.50

1.65

≥10000

1.40

1.60

1.80

TEST

PROCEDURE

(quick reference)

REQUIREMENTS

NAME OF TEST

REFERENCE

Endurance

IEC 384-4/

CECC 30300

subclause 4.13

Tamb = 125 °C; UR applied;

1000 hours

∆C/C: ±15%

tan

δ≤ 1.3 × spec. limit

≤ 2 × spec. limit

IL5 ≤ spec. limit

Useful life

CECC 30301

subclause 1.8.1

Tamb = 125 °C; UR and IR applied;

1500 hours

∆C/C: ±45%

tan

δ≤ 3 × spec. limit

≤ 3 × spec. limit

IL5 ≤ spec. limit

no short or open circuit

total failure percentage:

≤1%

Shelf life

IEC 384-4/

CECC 30300

subclause 4.17

Tamb = 125 °C; no voltage applied;

500 hours

after test: UR to be applied for 30 minutes,

24 to 48 hours before measurement

∆C/C: ±15%

tan

δ≤ 1.3 × spec. limit

≤ 2 × spec. limit

IL5 ≤ 2 × spec. limit

165RHT 데이터시트(PDF) 10 Page - NXP Semiconductors

165RHT 데이터시트(HTML) 10 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10

데이터시트 다운로드

링크 URL