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BSP75N 데이터시트(PDF) 4 Page - Diodes Incorporated |
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BSP75N 데이터시트(HTML) 4 Page - Diodes Incorporated |
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4 / 9 page ![]() BSP75N Document number: DS33016 Rev. 6 - 2 4 of 9 www.diodes.com June 2022 © 2022 Copyright Diodes Incorporated. All Rights Reserved. BSP75N Electrical Characteristics (@TA = +25°C, unless otherwise specified.) Characteristic Symbol Min Typ Max Unit Conditions Static Characteristics Drain-Source Clamp Voltage VDS(AZ) 60 70 75 V ID = 10mA Off State Drain Current IDSS — 0.1 3 µA VDS = 12V, VIN = 0V Off State Drain Current IDSS — 3 15 µA VDS = 32V, VIN = 0V Input Threshold Voltage (Note 8) VIN(TH) 1 2.1 — V VDS = VGS, ID = 1mA Input Current IIN — 0.7 1.2 mA VIN = 5V Input Current IIN — 1.5 2.7 mA VIN = 7V Input Current IIN — 4 7 mA VIN = 10V Static Drain-Source On-State Resistance RDS(ON) — 520 675 m Ω VIN = 5V, ID = 0.7A Static Drain-Source On-State Resistance RDS(ON) — 385 550 m Ω VIN = 10V, ID = 0.7A Current Limit (Note 9) ID(LIM) 0.7 1.0 1.5 A VIN = 5V, VDS > 5V Current Limit (Note 9) ID(LIM) 1 1.8 2.3 A VIN = 10V, VDS > 5V Dynamic Characteristics Turn-On Time (VIN to 90% ID) tON — 3 — μs RL = 22Ω, VIN = 0V to 10V, VDD = 12V Turn-Off time (VIN to 90% ID) tOFF — 13 — μs RL = 22Ω, VIN = 10V to 0V, VDD = 12V Slew Rate On (70 to 50% VDD) -dVDS/dtON — 8 — V/ μs RL = 22Ω, VIN = 0V to 10V, VDD = 12V Slew Rate Off (50 to 70% VDD) dVDS/dtON — 3.2 — V/ μs RL = 22Ω, VIN = 10V to 0V, VDD = 12V Protection Functions (Note 10) Minimum Input Voltage for Over Temperature Protection VPROT 4.5 — — V — Thermal Overload Trip Temperature TJT +150 +175 — °C — Thermal Hysteresis — — +1 — °C — Unclamped Single Pulse Inductive Energy TJ = +25°C EAS 550 — — mJ ID(ISO) = 0.7A, VDD = 32V Unclamped Single Pulse Inductive Energy TJ = +150°C EAS 200 — — mJ ID(ISO) = 0.7A, VDD = 32V Inverse Diode Source Drain Voltage VSD — — 1 V VIN = 0V, -ID = 1.4A Notes: 8. Protection features may operate outside spec for VIN < 4.5V. 9. The drain current is limited to a reduced value when VDS exceeds a safe level. 10. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the datasheet. Fault conditions are considered as “outside” normal operating range. Protection functions are not designed for continuous, repetitive operation. |
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