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SD12CT1 데이터시트(PDF) 2 Page - ON Semiconductor

부품명 SD12CT1
상세설명  Transient Voltage Suppressor(Bi-directional ESD Protection with Ultra Low Clamping Voltage)
PDF  4 Pages
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제조업체  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

SD12CT1 데이터시트(HTML) 2 Page - ON Semiconductor

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Bi−Directional TVS
IPP
IPP
V
I
IR
IT
IT
IR
VRWM
VC VBR
VRWM
VC
VBR
SD12CT1
http://onsemi.com
2
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Peak Power Dissipation @ 20
ms
@ TL ≤ 25°C
Ppk
350
W
IEC 61000−4−2 (ESD)
Air
Contact
±30
±30
kV
IEC 61000−4−4 (EFT)
40
A
Storage Temperature Range
Tstg
−55 to +150
°C
Operating Temperature Range
TJ
−55 to +125
°C
Lead Solder Temperature − Maximum (10 Second Duration)
TL
260
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise noted)
Symbol
Parameter
IPP
Maximum Reverse Peak Pulse Current
VC
Clamping Voltage @ IPP
VRWM
Working Peak Reverse Voltage
IR
Maximum Reverse Leakage Current @ VRWM
VBR
Breakdown Voltage @ IT
IT
Test Current
QVBR
Maximum Temperature Variation of VBR
ELECTRICAL CHARACTERISTICS (TJ = 25°C, unless otherwise specified)
Parameter
Conditions
Symbol
Min
Typ
Max
Unit
Reverse Working Voltage
(Note 1)
VRWM
12
V
Breakdown Voltage
IT = 1 mA, (Note 2)
VBR
13.3
V
Reverse Leakage Current
VRWM = 12 V
IR
1.0
mA
Clamping Voltage
Additional Clamping Voltage
IPP = 5 A, (8 x 20 msec Waveform)
IPP = 15 A, (8 x 20 msec Waveform)
VC
19
24
V
Maximum Peak Pulse Current
8 x 20
msec Waveform
IPP
15
A
Capacitance
VR = 0 V, f = 1 MHz
Cj
64
pF
VR = 12 V, f = 1 MHz
j
36
1. TVS devices are normally selected according to the working peak reverse voltage (VRWM), which should be equal or greater than the DC
or continuous peak operating voltage level.
2. VBR is measured at pulse test current IT.



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