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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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AD6654BBC 데이터시트(PDF) 57 Page - Analog Devices |
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AD6654BBC 데이터시트(HTML) 57 Page - Analog Devices |
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57 / 88 page  AD6654 Rev. 0 | Page 57 of 88 USER-CONFIGURABLE BUILT-IN SELF-TEST (BIST) Each channel of AD6654 includes a BIST block. The BIST, along with an internal test signal (pseudo random test input signal), can be used to generate a signature. This signature can be compared with a known good device and an untested device to see if the untested device is functional. BIST timer bits in the BIST control register can be programmed with a timer value that determines the number of clock cycles that the output of the channels (output of AGC) have accumulated. When the disable signature generation bit is written with Logic 0, the BIST timer is counted down and a signature register is written with the accumulated output of the AD6654 channel. When the BIST timer expires, the signature register for I and Q paths can be read back to compare it with the signature register from a known good device. |
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