Preliminary Technical Data

AD5371

Rev. P

rF | Page 9 of 25

ABSOLUTE MAXIMUM RATINGS

Transient currents of up to 100 mA do not cause SCR latch-up.

Table 4. Absolute Maximum Ratings

Parameter

Rating

−0.3 V to +17 V

−17 V to +0.3 V

−0.3 V to +7 V

Digital Inputs to DGND

Digital Outputs to DGND

−0.3 V to +7 V

VOUT0–VOUT39 to AGND

SIGGND to AGND

± 1 V

AGND to DGND

−0.3 V to +0.3 V

Industrial (B Version)

-40°C to +85°C

Storage Temperature Range

−65°C to +150°C

130°C

80-LQFP

38.72°C/w

100-CSPBGA

40°C/w

Reflow Soldering

Peak Temperature

230°C

Time at Peak Temperature

10 s to 40 s

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only, and functional operation of the device at these or

any other conditions above those listed in the operational

sections of this specification is not implied. Exposure to

absolute maximum rating conditions for extended periods may

affect device reliability.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on

the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance

degradation or loss of functionality.