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AS585xB

General Description

Short Datasheet

• PUBLIC

DS001023

• v1-00 • 2021-Apr-08

9

│ 4

Benefits

Features

Line time down to 20 µs, 15 µs with low OSR

or 10 µs with binning

LVDS data interface with data rate optimized

readout modes including fully parallel pipeline

mode

Adjustable full scale range from 0.5 pC to

16 pC

Correlated Double Sampling (CDS) operation for

offset compensation with programmable time

constant

On-chip voltage reference and temperature

sensor

Built-in Diagnostic (anti-blooming circuit, charge

injection mode, ADC test) for error detection

1.2

Applications

●

X-ray Flat Panel Detectors

●

Digital Radiography

●

Fluoroscopy Panels and Dynamic X-ray Detectors

●

Portable and Mobile X-ray Systems

●

Mammography Panels

●

Industrial and Security X-ray Scanners