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AD9514/PCB 데이터시트(PDF) 27 Page - Analog Devices |
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AD9514/PCB 데이터시트(HTML) 27 Page - Analog Devices |
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27 / 28 page ![]() AD9514 Rev. 0 | Page 27 of 28 PHASE NOISE AND JITTER MEASUREMENT SETUPS AD9514 CLK1 OUT1 OUT1B TERM TERM AMP +28dB ZFL1000VH2 ATTENUATOR –12dB EVALUATION BOARD AD9514 CLK1 OUT1 OUT1B TERM TERM AMP +28dB ZFL1000VH2 ATTENUATOR –7dB SIG IN REF IN EVALUATION BOARD WENZEL OSCILLATOR 0 ° SPLITTER ZESC-2-11 VARIABLE DELAY COLBY PDL30A 0.01ns STEP TO 10ns Figure 41. Additive Phase Noise Measurement Configuration AD9514 CLK1 OUT1 OUT1B TERM CLK ANALOG SOURCE TERM EVALUATION BOARD WENZEL OSCILLATOR WENZEL OSCILLATOR DATA CAPTURE CARD FIFO FFT PC ADC SNR tJ_RMS Figure 42. Jitter Determination by Measuring SNR of ADC () () []2 2 2 2 2 2 20 2π θ θ θ 10 A_PK A DNL THERMAL ON QUANTIZATI SNR A_RMS J_RMS V f BW SND V t × × + + − × − ⎥ ⎥ ⎦ ⎤ ⎢ ⎢ ⎣ ⎡ = where: tj_RMS is the rms time jitter. SNR is the signal-to-noise ratio. SND is the source noise density in nV/√Hz. BW is the SND filter bandwidth. VA is the analog source voltage. fA is the analog frequency. The θ terms are the quantization, thermal, and DNL errors. |
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