Supply Voltage

a

Output Voltage

Output Current

10 mA

Storage Temperature

b

Lead Temperature

SOT Package (Note 2)

Vapor Phase (60 seconds)

215 C

Infrared (15 seconds)

220 C

150 C

ESD Susceptibility (Note 3)

Human Body Model

2000V

Machine Model

200V

Specified Temperature Range

LM50C

b

LM50B

b

Operating Temperature Range

b

450 CW

a

a

05 mA in the circuit of

e

Parameter

Conditions

LM50B

LM50C

(Limit)

Units

Typical

Limit

Typical

Limit

(Note 5)

(Note 5)

Accuracy

g

20

g

30

C (max)

(Note 6)

g

30

g

40

C (max)

a

g

40

C (max)

Nonlinearity (Note 7)

g

08

g

08

C (max)

Sensor Gain

a

97

a

97

mV C (min)

(Average Slope)

a

103

a

103

mV C (max)

Output Resistance

2000

4000

2000

4000

X

(max)

Line Regulation

a

g

08

g

08

mVV (max)

(Note 8)

g

12

g

12

mVV (max)

Quiescent Current

a

130

130

m

A (max)

(Note 9)

180

180

m

A (max)

Change of Quiescent

a

20

20

m

A (max)

Current (Note 8)

Temperature Coefficient of

a

10

a

20

m

A C

Quiescent Current

Long Term Stability (Note 10)

g

008

g

008

C

1000 hours

Note 1

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating

the device beyond its rated operating conditions

Note 2

See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National

Semiconductor Linear Data Book for other methods of soldering surface mount devices

Note 3

Human body model 100 pF discharged through a 15 kX resistor Machine model 200 pF discharged directly into each pin

Note 4

Thermal resistance of the SOT-23 package is specified without a heat sink junction to ambient

Note 5

Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)

Note 6

Accuracy is defined as the error between the output voltage and 10mv C times the device’s case temperature at specified conditions of voltage current

and temperature (expressed in C)

Note 7

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature

range

Note 8

Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be

computed by multiplying the internal dissipation by the thermal resistance

Note 9

Quiescent current is defined in the circuit of

Figure 1

Note 10

For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature andor temperature cycled for at least 46

hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur The

majority of the drift will occur in the first 1000 hours at elevated temperatures The drift after 1000 hours will not continue at the first 1000 hour rate

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