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TPS73033DBVR 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 TPS73033DBVR
상세설명  LOW-NOISE, HIGH PSRR, RF 200-mA LOW-DROPOUT LINEAR REGULATORS
PDF  16 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI - Texas Instruments

TPS73033DBVR 데이터시트(HTML) 2 Page - Texas Instruments

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ABSOLUTE MAXIMUM RATINGS
TPS730xx
SBVS054G – NOVEMBER 2004 – REVISED DECEMBER 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION(1)
PRODUCT
VOUT(2)
TPS730xxyyyz
XX is nominal output voltage (for example, 28 = 2.8V, 01 = Adjustable).
YYY is package designator.
Z is package quantity.
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2)
Output voltages from 1.2V to 4.5V in 50mV increments are available through the use of innovative factory EEPROM programming;
minimum order quantities may apply. Contact factory for details and availability.
over operating temperature range (unless otherwise noted)(1)
UNIT
VIN range
–0.3V to +6V
VEN range
–0.3V to VIN + 0.3V
VOUT range
–0.3V to VIN + 0.3V
Peak output current
Internally limited
ESD rating, HBM
2kV
ESD rating, CDM
500V
Continuous total power dissipation
See Dissipation Ratings Table
Junction temperature range
–40
°C to +150°C
Storage temperature range, Tstg
–65
°C to +150°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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