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UPC358G2 데이터시트(PDF) 13 Page - Renesas Technology Corp

부품명 UPC358G2
상세설명  BIPOLAR ANALOG INTEGRATED CIRCUIT
PDF  14 Pages
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제조업체  RENESAS [Renesas Technology Corp]
홈페이지  http://www.renesas.com
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UPC358G2 데이터시트(HTML) 13 Page - Renesas Technology Corp

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Data Sheet G17929EJ3V0DS
11
μPC1251GR-9LG, μPC1251MP-KAA, μPC358GR-9LG
RECOMMENDED SOLDERING CONDITIONS
The
μ PC1251GR-9LG, μ PC1251MP-KAA, μ PC358GR-9LG should be soldered and mounted under the
following recommended conditions.
For soldering methods and conditions other than those recommended below, contact an NEC Electronics sales
representative.
For technical information, see the following website.
Semiconductor Device Mount Manual (http://www.necel.com/pkg/en/mount/index.html)
Type of Surface Mount Device
μ PC1251GR-9LG-A
Note, μPC1251GR(5)-9LG-A Note,
μ PC358GR-9LG-A
Note, μPC358GR(5)-9LG-A Note: 8-pin plastic TSSOP (5.72 mm (225))
μ PC1251MP-KAA-A
Note, μPC1251MP(5)-KAA-A Note: 8-pin plastic TSSOP (2.8 x 2.9)
Process
Conditions
Symbol
Infrared ray reflow
Peak temperature: 260
°C, Reflow time: 60 seconds or less (at 220°C or higher),
Maximum number of reflow processes: 3 times.
IR60-00-3
Wave soldering
Solder temperature: 260
°C or below, Flow time: 10 seconds or less, Maximum
number of flow processes: 1 time,
Pre-heating temperature: 120
°C or below (Package surface temperature).
WS60-00-1
Partial heating method
Pin temperature: 350
°C or below,
Heat time: 3 seconds or less (Per each side of the device).
P350
Note Pb-free (This product does not contain Pb in external electrode and other parts.)
Caution Apply only one kind of soldering condition to a device, except for “partial heating method”, or the
device will be damaged by heat stress.
Remark Flux: Rosin flux with low chlorine (0.2 Wt% or below) recommended.
REFERENCE DOCUMENTS
Document Name
Document No.
QUALITY GRADES ON NEC SEMICONDUCTOR DEVICES
C11531E
SEMICONDUCTOR DEVICE MOUNT MANUAL
http://www.necel.com/pkg/en/mount/index.html
NEC SEMICONDUCTOR DEVICE RELIABILITY/QUALITY CONTROL
SYSTEM-STANDARD LINEAR IC
IEI-1212
REVIEW OF QUALITY AND RELIABILITY HANDBOOK
C12769E
NEC SEMICONDUCTOR DEVICE RELIBIALITY/QUALITY CONTROL
SYSTEM
C10983E
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