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INA217AIP 데이터시트(PDF) 2 Page - Texas Instruments

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부품명 INA217AIP
상세설명  Low-Noise, Low-Distortion INSTRUMENTATION AMPLIFIER Replacement for SSM2017
PDF  11 Pages
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제조업체  TI [Texas Instruments]
홈페이지  http://www.ti.com
Logo TI - Texas Instruments

INA217AIP 데이터시트(HTML) 2 Page - Texas Instruments

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INA217
2
SBOS247B
www.ti.com
PACKAGE
PACKAGE
PRODUCT
PACKAGE-LEAD
DESIGNATOR
MARKING
INA217
SOL-16
DW
INA217
INA217
DIP-8
P
INA217
NOTES: (1) For the most current package and ordering information, see the
Package Option Addendum at the end of this document, or see the TI website
at www.ti.com.
Supply Voltage, V+ to V– ..................................................................
±18V
Signal Input Terminals, Voltage(2) .................. (V–) – 0.5V to (V+) + 0.5V
Current(2) .................................................... 10mA
Output Short-Circuit(3) .............................................................. Continuous
Operating Temperature .................................................. –55
°C to +125°C
Storage Temperature ..................................................... –55
°C to +150°C
Junction Temperature .................................................................... +150
°C
Lead Temperature (soldering, 10s) ............................................... +300
°C
NOTES: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability. (2) Input terminals are diode-clamped to the power-supply
rails. Input signals that can swing more than 0.5V beyond the supply rails
should be current limited to 10mA or less. (3) Short-circuit to ground, one
amplifier per package.
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATIONS
Top View
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
NC
RG
2
NC
V+
NC
V
OUT
REF
NC
NC
RG
1
NC
V
IN–
V
IN+
NC
V–
NC
SOL-16
NC = No Internal Connection
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
RG
2
V+
V
OUT
REF
RG
1
V
IN–
V
IN+
V–
DIP-8
8
7
6
5
1
2
3
4
PACKAGE/ORDERING INFORMATION(1)



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