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AM29LV065MU112REF 데이터시트(PDF) 56 Page - Advanced Micro Devices |
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AM29LV065MU112REF 데이터시트(HTML) 56 Page - Advanced Micro Devices |
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56 / 62 page ![]() 54 Am29LV065MU September 12, 2006 DA TA SH EET ERASE AND PROGRAMMING PERFORMANCE Notes: 1. Typical program and erase times assume the following conditions: 25 °C, 3.0 V V CC, 100,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90 °C, V CC = 3.0 V, 100,000 cycles. 3. Effective write buffer specification is based upon a 32–byte write buffer operation. 4. Byte programming specification is based upon a single byte programming operation not utilizing the write buffer. 5. In the pre-programming step of the Embedded Erase algorithm, all bits are programmed to 00h before erasure. 6. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 10 for further information on command definitions. 7. The device has a minimum erase and program cycle endurance of 100,000 cycles. LATCHUP CHARACTERISTICS Note: Includes all pins except V CC. Test conditions: VCC = 3.0 V, one pin at a time. Parameter Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time 0.5 15 sec Excludes 00h programming prior to erasure (Note 5) Chip Erase Time 64 128 sec Effective Byte Program Time, using the Write Buffer (Note 3) 11 57 µs Excludes system level overhead (Note 6) Effective Accelerated Byte Program Time, using the Write Buffer (Note 3) 8.8 49 µs Single Byte Program Time 100 800 µs Accelerated Single Byte Program Time (Note 4) 90 720 µs Chip Program Time, using the Write Buffer 92 170 sec Description Min Max Input voltage with respect to V SS on all pins except I/O pins (including A9, OE#, and RESET#) –1.0 V 12.5 V Input voltage with respect to V SS on all I/O pins –1.0 V V CC + 1.0 V V CC Current –100 mA +100 mA |
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