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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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AM29DS32XG 데이터시트(PDF) 36 Page - SPANSION |
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AM29DS32XG 데이터시트(HTML) 36 Page - SPANSION |
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36 / 52 page  May 15, 2002 Am29DS32xG 35 ADV ANC E INFO RMAT ION TEST CONDITIONS Table 16. Test Specifications KEY TO SWITCHING WAVEFORMS CL Device Under Test Note: Diodes are IN3064 or equivalent Figure 11. Test Setup Test Condition 70, 90 120 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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