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AM29LV320ML112REF 데이터시트(PDF) 42 Page - Advanced Micro Devices |
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AM29LV320ML112REF 데이터시트(HTML) 42 Page - Advanced Micro Devices |
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42 / 59 page ![]() 40 Am29LV320MH/L 26517B4 January 31, 2007 D A TA SH EE T AC CHARACTERISTICS Read-Only Operations Notes: 1. Not 100% tested. 2. See Figure 12 and Table 13 for test specifications. 3. AC specifications listed are tested with VIO = VCC. Contact AMD for information on AC operation VIO ≠ VCC. Parameter Description Test Setup Speed Options JEDEC Std. 90R 101, 101R 112R 112 120R 120 Unit tAVAV tRC Read Cycle Time (Note 1) Min 90 100 110 120 ns tAVQV tACC Address to Output Delay CE#, OE# = V IL Max 90 100 110 120 ns t ELQV t CE Chip Enable to Output Delay OE# = V IL Max 90 100 110 120 ns t PACC Page Access Time Max 253030403040 ns t GLQV t OE Output Enable to Output Delay Max 253030403040 ns tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 16 ns t GHQZ t DF Output Enable to Output High Z (Note 1) Max 16 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First Min 0 ns tOEH Output Enable Hold Time (Note 1) Read Min 0 ns Toggle and Data# Polling Min 10 ns tOH tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tRH tOE tRH 0 V RY/BY# RESET# tDF Figure 14. Read Operation Timing |
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