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TC7135CBU 데이터시트(PDF) 10 Page - Microchip Technology |
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TC7135CBU 데이터시트(HTML) 10 Page - Microchip Technology |
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10 / 24 page ![]() TC7135 DS21460C-page 10 2004 Microchip Technology Inc. FIGURE 5-2: Timing Diagrams For Outputs. 5.1 RUN/HOLD Input When left open, this pin assumes a logic ‘1’ level. With a RUN/HOLD = 1, the TC7135 performs conversions continuously, with a new measurement cycle beginning every 40,002 clock pulses. When RUN/HOLD changes to a logic ‘0’, the measure- ment cycle in progress will be completed, with the data held and displayed as long as the logic ‘0’ condition exists. A positive pulse (>300 nsec) at RUN/HOLD initiates a new measurement cycle. The measurement cycle in progress when RUN/HOLD initially assumed the logic ‘0’ state must be completed before the positive pulse can be recognized as a single conversion run command. The new measurement cycle begins with a 10,001 count auto-zero phase. At the end of this phase, the busy signal goes high. 5.2 STROBE Output During the measurement cycle, the STROBE control line is pulsed low five times. The five low pulses occur in the center of the digit drive signals (D1, D2, D3, D5) (see Figure 5-3). D5 (MSD) goes high for 201 counts when the measurement cycles end. In the center of the D5 pulse, 101 clock pulses after the end of the measurement cycle, the first STROBE occurs for one half clock pulse. After the D5 digit strobe, D4 goes high for 200 clock pulses. The STROBE then goes low 100 clock pulses after D4 goes high. This continues through the D1 digit drive pulse. The digit drive signals will continue to permit display scanning. STROBE pulses are not repeated until a new measurement is completed. The digit drive signals will not continue if the previous signal resulted in an overrange condition. The active-low STROBE pulses aid BCD data transfer to UARTs, processors and external latches. For more information, please refer to Application Note 784 (DS00784). FIGURE 5-3: Strobe Signal Low Five Times Per Conversion. Integrator Output Overrange when Applicable Underrange when Applicable System Zero 10,001 Counts Signal Integrate 10,000 Counts (Fixed) Reference Integrate 20,001 Counts (Max) Full Measurement Cycle 40,002 Counts Busy Expanded Scale Below D5 D4 D3 D2 D1 100 Counts Digit Scan STROBE Auto-Zero Signal Integrate Reference Integrate D5 D4 D3 D2 D1 Digit Scan for Overrange * First D5 of System Zero and Reference Integrate One Count Longer * * End of Conversion (MSD) Data Busy B1 B8 STROBE D5 D4 D3 D2 D1 D4 Data D3 Data D2 Data (LSD) Data D5 Data Note Absence of STROBE 201 Counts 200 Counts 200 Counts 200 Counts 200 Counts 200 Counts 200 Counts * *Delay between Busy going Low and First STROBE pulse is dependent on Analog Input. TC835 Outputs D5 D1 |
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