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P4C1256-35JMBLF 데이터시트(PDF) 8 Page - Pyramid Semiconductor Corporation

부품명 P4C1256-35JMBLF
상세설명  HIGH SPEED 32K x 8 STATIC CMOS RAM
PDF  17 Pages
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제조업체  PYRAMID [Pyramid Semiconductor Corporation]
홈페이지  http://www.pyramidsemiconductor.com
Logo PYRAMID - Pyramid Semiconductor Corporation

P4C1256-35JMBLF 데이터시트(HTML) 8 Page - Pyramid Semiconductor Corporation

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P4C1256
Page 8 of 17
Document # SRAM119 REV G
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Times
3ns
Input Timing Reference Level
1.5V
Output Timing Reference Level
1.5V
Output Load
See Figures 1 and 2
AC TEST CONDITIONS
Figure 1. Output Load
Figure 2. Thevenin Equivalent
* including scope and test fixture.
Note:
Because of the ultra-high speed of the P4C1256, care must be taken when
testing this device; an inadequate setup can cause a normal functioning part
to be rejected as faulty. Long high-inductance leads that cause supply
bounce must be avoided by bringing the V
CC and ground planes directly up
to the contactor fingers. A 0.01 µF high frequency capacitor is also required
between V
CC and ground. To avoid signal reflections, proper termination
must be used; for example, a 50
Ω test environment should be terminated
into a 50
Ω load with 1.73V (Thevenin Voltage) at the comparator input,
and a 116
Ω resistor must be used in series with D
OUT to match 166Ω
(Thevenin Resistance).
Write
Active
Read
TRUTH TABLE
Mode
Standby
Standby
D
OUT Disabled
Standby
Power
I/O
WE
WE
WE
WE
WE
OE
OE
OE
OE
OE
CE
CE
CE
CE
CE
High Z
High Z
D
OUT
High Z
X
X
H
H
L
X
X
H
L
X
H
L
L
L
Standby
Active
Active
High Z
X



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