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ADL8154-EVALZ 데이터시트(PDF) 5 Page - Analog Devices

부품명 ADL8154-EVALZ
상세설명  Low Phase Noise Amplifier, 10 MHz to 6 GHz
PDF  23 Pages
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제조업체  AD [Analog Devices]
홈페이지  http://www.analog.com
Logo AD - Analog Devices

ADL8154-EVALZ 데이터시트(HTML) 5 Page - Analog Devices

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Data Sheet
ADL8154
ABSOLUTE MAXIMUM RATINGS
analog.com
Rev. 0 | 5 of 23
Table 5. Absolute Maximum Ratings
Parameter
Rating
VCC
6.5 V
RF Input Power (RFIN)
27 dBm
Continuous Power Dissipation (PDISS),
TCASE = 85°C (Derate 14.9 mW/°C Above 85°C)
1.34 W
Temperature
Storage Range
−65°C to +150°C
Operating Range
−55°C to +125°C
Quiescent Junction (TCASE = 85°C, VCC = 5 V,
ICQ = 125 mA, Input Power (PIN) = Off)
127°C
Maximum Junction
175°C
Stresses at or above those listed under Absolute Maximum Ratings
may cause permanent damage to the product. This is a stress
rating only; functional operation of the product at these or any other
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operat-
ing conditions for extended periods may affect product reliability.
THERMAL RESISTANCE
Thermal performance is directly linked to printed circuit board
(PCB) design and operating environment. Careful attention to PCB
thermal design is required.
θJC is the junction to case thermal resistance.
Table 6. Thermal Resistance1
Package Type
θJC
Unit
CP-8-30
Quiescent, TCASE = 25°C
59.5
°C/W
Worst Case2, TCASE = 85°C
67.2
°C/W
1 Thermal resistance varies with operating conditions.
2 Across all specified operating conditions.
ELECTROSTATIC DISCHARGE (ESD) RATINGS
The following ESD information is provided for handling of ESD-sen-
sitive devices in an ESD protected area only.
Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
ESD Ratings for ADL8154
Table 7. ADL8154, 8-Lead LFCSP
ESD Model
Withstand Threshold (V)
Class
HBM
±500
1B
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Charged devi-
ces and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
damage may occur on devices subjected to high energy ESD.
Therefore, proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.



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