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SC2738IMSTRT 데이터시트(PDF) 2 Page - Semtech Corporation |
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SC2738IMSTRT 데이터시트(HTML) 2 Page - Semtech Corporation |
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2 / 13 page ![]() 2 2004 Semtech Corp. www.semtech.com SC2738 PRELIMINARY POWER MANAGEMENT Absolute Maximum Ratings r e t e m a r a Pl o b m y Sm u m i x a Ms t i n U e g a tl o V y l p p u S t u p n IV N I 2 . 3 1 + o t 3 . 0 -V s n i P e v ir DV V R D 0 . 8 + o t 3 . 0 -V s n i P d o o G r e w o P d n a t s u j d AV J D A V , D G P 5 . 5 + o t 3 . 0 - ) 1 ( V s n i P e l b a n EV N E V o t 3 . 0 - N I V t n e i b m A o t n o it c n u J e c n a d e p m I l a m r e h T θ A J 3 1 1W / C ° e s a C o t n o it c n u J e c n a d e p m I l a m r e h T θ C J 2 4W / C ° e g n a R e r u t a r e p m e T t n e i b m A g n it a r e p OT A 5 8 + o t 0 4 -C ° e g n a R e r u t a r e p m e T n o it c n u J g n it a r e p OT J 0 5 1 + o t 0 4 -C ° e g n a R e r u t a r e p m e T e g a r o t ST G T S 0 5 1 + o t 5 6 -C ° . c e S 0 1 ) g n ir e d l o S ( e r u t a r e p m e T d a e LT D A E L 0 0 3C ° )l e d o M y d o B n a m u H ( g n it a R D S ED S E2 V k r e t e m a r a Pl o b m y Ss n o i t i d n o C t s e Tn i Mp y Tx a Ms t i n U N I e g a tl o V y l p p u SV N I 5 . 42 . 3 1 V t n e r r u C t n e c s e i u QI Q V N I V 5 =0 0 5 0 0 7 A µ V N I V 2 1 =0 0 6 0 0 9 A µ t n e r r u C y b d n a t SI ) F F O ( Q w o l N E h t o B1 . 0 0 . 1 A µ V , w o l N E h t o B N I V 2 1 = 0 . 5 1 t u o k c o L e g a t l o v r e d n U d l o h s e r h T t r a t SV O L V U V N I g n i s ir5 7 . 3V s i s e r e t s y HV T S Y H V N I g n il l a f0 5 . 0V Electrical Characteristics Unless specified: T A = 25°C, VIN = VEN = 5V ± 5%, VPWR (1) = 1.5V ± 5%, 0A ≤ I OUT ≤ 3A. Values in bold apply over full operating ambient temperature range. Note: (1) Or V IN, if VIN ≤ 5V. Exceeding the specifications below may result in permanent damage to the device, or device malfunction. Operation outside of the parameters specified in the Electrical Characteristics section is not implied. Exposure to Absolute Maximum rated conditions for extended periods of time may affect device reliability. |
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