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ABSOLUTE MAXIMUM RATINGS

(1)

PIN CONFIGURATION

1

IN

2

OUT

3

GND

REF3312,, REF3318

REF3320, REF3325

REF3330, REF3333

SBOS392A – AUGUST 2007 – REVISED SEPTEMBER 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PRODUCT

DESCRIPTION

PACKAGE

DESIGNATOR

PACKAGE MARKING

SOT23-3

DBZ

R33A

REF3312

1.25V

SC70-3

DCK

R12

SOT23-3

DBZ

R33B

REF3318

1.8V

SC70-3

DCK

R18

SOT23-3

DBZ

R33C

REF3320

2.048V

SC70-3

DCK

R20

SOT23-3

DBZ

R33D

REF3325

2.5V

SC70-3

DCK

R25

SOT23-3

DBZ

R33E

REF3330

3.0V

SC70-3

DCK

R30

SOT23-3

DBZ

R33F

REF3333

3.3V

SC70-3

DCK

R33

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

VALUE

UNIT

+7.5

V

180

mA

5

V

Operating Temperature

–50 to +150

°C

Storage Temperature

–65 to +150

°C

+150

°C

Human Body Model (HBM)

4000

V

ESD Ratings

Charged Device Model (CDM)

1000

V

Machine Model (MM)

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2)

REF3312, REF3318, REF3320, REF3325, REF3330, REF3333

SOT23-3, SC70-3

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Product Folder Link(s): REF3312 REF3318 REF3320 REF3325 REF3330 REF3333