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ST10F273E 데이터시트(PDF) 37 Page - STMicroelectronics

부품명 ST10F273E
상세설명  16-bit MCU with 512 Kbyte Flash memory and 36 Kbyte RAM
PDF  179 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST10F273E 데이터시트(HTML) 37 Page - STMicroelectronics

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ST10F273E
Internal Flash memory
37/179
5.5.2
Flash non volatile write protection I register low
FNVWPIRL (0x0E DFB4)
NVR
Delivery value: FFFFh
5.5.3
Flash non volatile write protection I register high
FNVWPIRH (0x0E DFB6)
NVR
Delivery value: FFFFh
5.5.4
Flash non volatile access protection register 0
FNVAPR0 (0x0E DFB8)
NVR
Delivery value: ACFFh
15
14
13
12
11
10
9876543
210
reserved
W0P9 W0P8 W0P7 W0P6 W0P5 W0P4 W0P3 W0P2 W0P1 W0P0
RW
RW
RW
RW
RW
RW
RW
RW
RW
RW
Table 19.
Flash non volatile write protection register low
Bit
Function
W0P(9:0)
Write protection bank 0 / sectors 9-0
These bits, if programmed at 0, disable any write access to the sectors of Bank 0 (IFlash).
15
14
13
12
11
10
9876543
210
reserved
W1P1 W1P0
RW
RW
Table 20.
Flash non volatile protection register high
Bit
Function
W1P(1:0)
Write protection bank 1 / sectors 1-0
These bits, if programmed at 0, disable any write access to the sectors of Bank 1 (IFlash).
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
reserved
DBGP ACCP
RW
RW
Table 21.
Flash non volatile access protection register 0
Bit
Function
ACCP
Access protection
This bit, if programmed at 0, disables any access (read/write) to data mapped inside IFlash Module
address space, unless the current instruction is fetched from IFlash.
DBGP
Debug protection
This bit, if erased at 1, allows to by-pass all the protections using the Debug features through the
Test Interface. If programmed at 0, on the contrary, all the debug features, the Test Interface and all
the Flash Test Modes are disabled. Even STMicroelectronics will not be able to access the device
to run any eventual failure analysis.



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