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SSM3K04FS 데이터시트(PDF) 1 Page - Toshiba Semiconductor |
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SSM3K04FS 데이터시트(HTML) 1 Page - Toshiba Semiconductor |
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1 / 5 page ![]() SSM3K04FS 2007-11-01 1 TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM3K04FS High Speed Switch Applications • With built-in gate-source resistor: RGS = 1 MΩ (typ.) • 2.5 V gate drive • Low gate threshold voltage: Vth = 0.7~1.3 V • Small package Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Drain-source voltage VDS 20 V Gate-source voltage VGSS 10 V DC drain current ID 100 mA Drain power dissipation PD 100 mW Channel temperature Tch 150 °C Storage temperature range Tstg −55~150 °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Marking Equivalent Circuit Unit: mm JEDEC ― JEITA ― TOSHIBA 2-2H1B Weight: 2.4 mg (typ.) |
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