HS-1840ARH, HS-1840AEH, HS-1840BRH, HS-1840BEH

FN4355 Rev 6.00

Page 4 of 7

May 23, 2013

Burn-In/Life Test Circuits

FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT

FIGURE 2. .STATIC BURN-IN TEST CIRCUIT

NOTES:

1. The above test circuits are utilized for all package types.

2. The Dynamic Test Circuit is utilized for all life testing.

Irradiation Circuit

HS-1840ARH, HS-1840AEH, HS-1840BRH, HS-1840BEH

NOTE:

3. All irradiation testing is performed in the 28 lead CERDIP package.

R

R

GND

+VS

R

28

27

26

25

24

23

22

21

20

19

18

17

16

15

1

2

3

4

5

6

7

8

9

10

11

12

13

14

F4

F3

F1

F5

F2

-VS

NOTE:

VS+ = +15.5V ±0.5V, VS- = -15.5V ±0.5V.

R = 1kΩ ±5%.

C1 = C2 = 0.01µF ±10%, 1 EACH PER SOCKET, MINIMUM.

D1 = D2 = 1N4002, 1 EACH PER BOARD, MINIMUM.

INPUT SIGNALS:

SQUARE WAVE, 50% DUTY CYCLE, 0V TO 15V PEAK ±10%.

F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.

10

11

12

13

14

28

27

26

25

24

23

22

21

20

19

18

17

16

15

1

2

3

4

5

6

7

8

9

R

R

R

GND

VR

+VS

R

-VS

NOTE:

R = 1kΩ ±5%, 1/4W.

C1 = C2 = 0.01µF MINIMUM, 1 EACH PER SOCKET, MINIMUM.

VS+ = 15.5V ±0.5V, VS- = -15.5V ±0.5V, VR = 15.5 ±0.5V

28

27

26

25

24

23

22

21

20

19

18

17

16

15

1k



+15V

+1V

+5V

NC

NC

-15V

1

2

3

4

5

6

7

8

9

10

11

12

13

14