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BMP581 데이터시트(PDF) 13 Page - Bosch Sensortec GmbH

부품명 BMP581
상세설명  Barometric Pressure Sensor
PDF  75 Pages
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제조업체  BOSCH [Bosch Sensortec GmbH]
홈페이지  https://www.bosch-sensortec.com
Logo BOSCH - Bosch Sensortec GmbH

BMP581 데이터시트(HTML) 13 Page - Bosch Sensortec GmbH

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Bosch Sensortec | BST-BMP581-DS004-11
13 | 75
© Bosch Sensortec GmbH 2023 | All rights reserved, also regarding any disposal, exploitation, reproduction, editing, distribution,
Document number: BST-BMP581-DS004-11
as well as in the event of applications for industrial property rights
NVM user write
cyclesb
NNVM_WRITE
Number of write
cycles to NVM
user range
10,000
writes
a. For supply ramps < 0.01 ms, a 10 Ohm resistor must be connected in series to the power supply (see 5.2.5).
b. power supply must be stabe during the write sequency. Temperature must be in the range of 0 - 65 °C.
Table 5: Interface pin electrical characteristics
Parameter
Symbol
Comment
Min
Typ
Max
Unit
Input low voltage
VIL
@VDDIO=1.2V/
1.8V/3.3V+/-10%
30
%
Input high voltage
VIH
@VDDIO=1.2V/
1.8V/3.3V+/-10%
70
%
Input voltage
hysteresis
VIHYST
@VDDIO=1.2V/
1.8V/3.3V+/-10%
10
%
Output low voltage
VOL
@VDDIO=1.2V/
1.8V/3.3V+/-10%
20
%
Output high
voltage
VOH
@VDDIO=1.2V/
1.8V/3.3V+/-10%
80
%
Pull-up resistance
at CSB pin
RPU_CSB
I2C mode,
relevant for
interface mode
selection
74
100
131
kOhm
Table 6: Absolute maximum ratings
Parameter
Symbol
Comment
Min
Max
Unit
Storage temperaturea
≤ 65 % r.h.
Standard
conditions: +
25°C and
40% r.h.
-40
+125
°C
Supply voltage VDD
-0.3
4.3
V
Supply voltage VDDIO
-0.3
4.3
V
Max Voltage at I/O Pins
VSSIO-0.3 V VDDIO + 0.3 V
V
a.
Storage should occur at standard conditions. For short time periods, the device may be stored outside of this range, but must stay within above mentioned limits.
Stress above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device under these conditions is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability.



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