FN8861 Rev. 1.00

Page 11 of 28

Jul 27, 2017

ISL72026ASEH

2. Specifications

2.5

Test Circuits and Waveforms

RS Pin Characteristics

RS Input Current

IRS(H)

RS = 0.75 x VCC

Full

-10

-0.2

-

µA

IRS(L)

VRS = 0V

Full

-450

-125

0

µA

Notes:

7. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground

unless otherwise specified.

8. Parameters with MIN and/or MAX limits are 100% tested at -55°C, +25°C, and +125°C, unless otherwise specified.

9. Typical values are at 3.3V. Parameters with a single entry in the “TYP” column apply to 3.3V. Typical values shown are not

guaranteed.

10. Parameter included in functional testing.

11. Performed during the 100% screening operations over the full operating temperature range. Not performed as part of TCI Group

E and Group C. Radiation characterization testing performed as part of the initial release and any major changes in design.

Figure 10. Driver Test Circuit

Figure 11. Driver Bus Voltage Definitions

Figure 12. Driver Common Mode Circuit

Figure 13. Driver Timing Test Circuit

Figure 14. Driver Timing Measurement Points

Test Conditions: VCC = 3.0V to 3.6V. Typical values are at TA = +25°C (Note 9); unless otherwise specified (Note 7). Boldface limits

apply across the operating temperature range, -55°C to +125°C and over a total ionizing dose of 75krad(Si) at +25°C with

exposure at a low dose rate of <10mrad(Si)/s. (Continued)

Parameter

Symbol

Test Conditions

Temp

(°C)

Min

(Note 8)

Typ

(Note 9)

Max

(Note 8)Unit

CANH

CANL

GND

D

60Ω

V

V

VO(CANH)

VO(CANL)

RECESSIVE

DOMINANT

3V

2.3V

1V

VOD

VO(CANH)

VO(CANL)

CANH

CANL

GND

D

60Ω

V -7V < VCM < 12V

330Ω

330Ω

CANH

CANL

GND

D

60Ω

V VO

±1%

CL

50pF

±20%

VIN

VIN = 125kHz, 0V TO VCC, DUTY CYCLE 50%, tr = tf ≤ 6ns, ZO = 50Ω

CL INCLUDES FIXTURE AND INSTRUMENTATION CAPACITANCE

SCOPE

tPLH

90%

0.9V

10%

0.5V

tPHL

VIN

VO

VDOM

VREC

VCC

0V

0.5 x VCC

tr

tf