TLV2354, TLV2354Y

LinCMOS

™ QUADRUPLE LOW-VOLTAGE DIFFERENTIAL COMPARATORS

SLCS012C – MAY 1992 – REVISED AUGUST 2000

13

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

PARAMETER MEASUREMENT INFORMATION

Propagation delay time is defined as the interval between the application of an input step function and the instant when

the output crosses VO = 1 V with VDD = 3 V or when the output crosses VO = 1.4 V with VDD = 5 V. Propagation delay

time, low-to-high-level output, is measured from the leading edge of the input pulse, while propagation delay time,

high-to-low-level output, is measured from the trailing edge of the input pulse. Propagation-delay-time measurement

at low input signal levels can be greatly affected by the input offset voltage. The offset voltage should be balanced

by the adjustment at the inverting input (as shown in Figure 11) so that the circuit is just at the transition point. Then

a low signal, for example a 105-mV or 5-mV overdrive, causes the output to change state.

+

–

DUT

VDD

CL

(see Note A)

Pulse

Generator

10

Ω

10 Turn

+ 1 V

– 1 V

1 k

Ω

50

Ω

1

µF

0.1

µF

TEST CIRCUIT

100 mV

Input

Overdrive

tPLH

100 mV

Input

Overdrive

90%

10%

tf

tPHL

Low- to High-

Level Output

High- to Low-

Level Output

VOLTAGE WAVEFORMS

5.1 k

Ω

Input Offset Voltage

Compensation

Adjustment

90%

10%

tr

VO = 1 V With VDD = 3 V

or

VO = 1.4 V With VDD = 5 V

NOTE A: CL includes probe and jig capacitance.

Figure 11. Propagation Delay, Rise, and Fall Times Test Circuit and Voltage Waveforms