DEVICE CHARACTERISTICS

10

15

20

25

30

35

40

20

30

40

50

60

70

80

90

100 110 120

f-Frequency-MHz

V

=3.3V

DD

CDCS501

SCAS874 – APRIL 2009..................................................................................................................................................................................................... www.ti.com

over recommended operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

IDD

Device supply current

fIN = 80 MHz

26

mA

fOUT

Output frequency

40

108

MHz

IIH

LVCMOS input current

VI = VDD; VDD = 3.6V

10

µA

IIL

LVCMOS input current

VI = 0 V; VDD = 3.6V

–10

µA

IOH = –0.1mA

2.9

VOH

LVCMOS high-level output voltage

IOH = –8mA

2.4

V

IOH = –12mA

2.2

IOL = 0.1mA

0.1

VOL

LVCMOS low-level output voltage

IOL = 8mA

0.5

V

IOL = 12mA

0.8

tJIT(C-C)

Cycle to cycle jitter cycles

fout = 80 MHz; SSC = 1%, 10000 cycles

110

ps

tr/tf

Rise and fall time

20%–80%

0.75

ns

Odc

Output duty cycle

45%

55%

fMOD

Modulation frequency

30

kHz

Figure 1. IDD vs. Input Frequency, VDD = 3.3V

4

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