INA159

SBOS333B − JULY 2005 − REVISED OCTOBER 2005

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4

20k

Ω

40k

Ω

100k

Ω

2

3

7

5

OUT

1

8

6

V+

4

V

−

+5V

100k

Ω

40k

Ω

INA159

The test is performed by

measuring the output

with the reference

appliedtoalternate

reference resistors, and

calculating a result such

that the amplifier offset is

cancelled in the final

measurement.

Figure 2. Test Circuit for Reference Divider Accuracy

TYPICAL CHARACTERISTICS

At TA = +25°C, RL = 10kΩ connected to VS/2, REF pin 1 connected to ground, and REF pin 2 connected to VREF = 5V, unless otherwise noted.

OFFSET VOLTAGE PRODUCTION DISTRIBUTION

Offset Voltage (

µV)

OFFSET VOLTAGE DRIFT PRODUCTION DISTRIBUTION

Offset Voltage Drift (

µV/_C)

GAIN vs FREQUENCY

Frequency (Hz)

0

−10

−20

−30

−40

−50

100

1k

10k

100k

1M

10M

10

POWER−SUPPLY REJECTION RATIO vs FREQUENCY

Frequency (Hz)

130

120

110

100

90

80

70

60

50

40

30

20

10

0

−10

100

1k

10k

100k

1M

10M

10