| 전자부품 데이터시트 검색엔진 |
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DS26C32AME/883 데이터시트(PDF) 8 Page - Texas Instruments |
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DS26C32AME/883 데이터시트(HTML) 8 Page - Texas Instruments |
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8 / 20 page ![]() DS26C32AMQML SNOSAS3A – OCTOBER 2010 – REVISED APRIL 2013 www.ti.com AC TEST CIRCUIT AND SWITCHING TIME WAVEFORMS CL includes load and test jig capacitance. S1 = VCC for tPZL, and tPLZ measurements. S1 = Gnd for tPZH, and tPHZ measurements. Figure 18. Test Circuit for TRI-STATE Output Tests Figure 19. Propagation Delay Figure 20. TRI-STATE Output Enable and Disable Waveforms TYPICAL APPLICATIONS Figure 21. Two-Wire Balanced Systems, RS-422 8 Submit Documentation Feedback Copyright © 2010–2013, Texas Instruments Incorporated Product Folder Links: DS26C32AMQML |
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