SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate

1 Features

• 5962R87549:

– Radiation hardness assurance (RHA) up to TID

100 krad (Si)

– SEL immune to 86 MeV×cm2/mg

• 5962-87549:

– Total ionizing dose 50 krad (Si)

• 2 V to 6 V VCC operation

• Inputs accept voltages to 6 V

• Maximum tpd of 7 ns at 5 V

2 Applications

• Satellite payloads

• Satellite power on reset logic

• RHA known good Die (KGD) offering for space

hybrids

Pin Functions (Each Gate)

INPUTS

OUTPUT

Y

A

B

H

H

L

L

X

H

X

L

H

Y

B

A

Logic Diagram (Positive Logic)

3 Description

The SN54AC00 device contains four independent 2-

input NAND gates. Each gate performs the Boolean

function of Y = A • B or Y = A + B in positive logic.

Device Information(1)

PART NUMBER

PACKAGE

BODY SIZE (NOM)

SN54AC00-SP

CDIP (14)

5.97 mm × 9.21 mm

CFP (14)

6.67 mm × 19.56 mm

KGD (0)

Not applicable

(1)

For all available packages, see the orderable addendum at

the end of the data sheet.

.

.

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

1Y

2A

2B

2Y

GND

VCC

4B

4A

4Y

3B

3A

3Y

J or W Package

(Top View)

SN54AC00-SP

SCHS367C – OCTOBER 2008 – REVISED APRIL 2022

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.