| 전자부품 데이터시트 검색엔진 |
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CD74ACT175M 데이터시트(PDF) 8 Page - Texas Instruments |
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CD74ACT175M 데이터시트(HTML) 8 Page - Texas Instruments |
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8 / 19 page ![]() A. CL includes probe and test-fixture capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns. Phase relationships between waveforms are arbitrary. D. For clock inputs, fmax is measured with the input duty cycle at 50%. E. The outputs are measured one at a time with one input transition per measurement. F. tPLH and tPHL are the same as tpd. G. tPZL and tPZH are the same as ten. H. tPLZ and tPHZ are the same as tdis. I. All parameters and waveforms are not applicable to all devices. TEST S1 tPLH/tPHL Open tPLZ/tPZL 2 × VCC tPHZ/tPZH GND CD74ACT175 SCHS345A – APRIL 2003 – REVISED MAY 2024 www.ti.com 8 Submit Document Feedback Copyright © 2024 Texas Instruments Incorporated Product Folder Links: CD74ACT175 |
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