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LM48100QMHE/NOPB 데이터시트(PDF) 4 Page - Texas Instruments |
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LM48100QMHE/NOPB 데이터시트(HTML) 4 Page - Texas Instruments |
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4 / 31 page ![]() LM48100Q-Q1 SNAS470E – OCTOBER 2008 – REVISED NOVEMBER 2015 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings See (1) (2) (3) MIN MAX UNIT Supply voltage, continuous 6 V Input voltage −0.3 VDD + 0.3 °C Power dissipation(4) Internally Limited Junction temperature 150 °C Lead temperature (soldering 4 sec)(5) 260 °C Storage temperature −65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The Electrical Characteristics tables found in Specifications list ensured specifications under the listed Recommended Operating Conditions except as otherwise modified or specified by the Electrical Characteristics Test Conditions, Notes, or both. Typical specifications are estimations only and are not ensured. (3) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications. (4) θJA measured with a 4 layer JEDEC board. (5) For detailed information on soldering plastic HTSSOP and LLP packages go to the TI Packaging site, ti.com/packaging. 6.2 ESD Ratings VALUE UNIT Human-body model (HBM), per AEC Q100-002(1) 2500 V(ESD) Electrostatic discharge V Charged-device model (CDM), per AEC Q100-011 300 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions MIN MAX UNIT Temperature TMIN ≤ TA ≤ TMAX −40 105 °C Supply voltage VDDand PVDD 3 5.5 V 1.8 5.5 V I2C Supply voltage I2CVDD I2CVDD VDD V 6.4 Thermal Information LM48100Q-Q1 THERMAL METRIC(1) PWP (HTSSOP) UNIT 14 PINS RθJA Junction-to-ambient thermal resistance 37.8 °C/W RθJC(top) Junction-to-case (top) thermal resistance 5.2 °C/W RθJB Junction-to-board thermal resistance — °C/W ψJT Junction-to-top characterization parameter — °C/W ψJB Junction-to-board characterization parameter — °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance — °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. 4 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: LM48100Q-Q1 |
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