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DIX9211 데이터시트(PDF) 8 Page - Texas Instruments |
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DIX9211 데이터시트(HTML) 8 Page - Texas Instruments |
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8 / 70 page ![]() 8 DIX4192-Q1 SBFS041A – JULY 2016 – REVISED APRIL 2017 www.ti.com Product Folder Links: DIX4192-Q1 Submit Documentation Feedback Copyright © 2016–2017, Texas Instruments Incorporated Timing Requirements (continued) MIN NOM MAX UNIT (1) All values referred to the VIH minimum and VIL maximum levels listed in the Digital I/O Characteristics section of this table. (2) A device must internally provide a hold time of at least 300 ns for the SDA signal (referred to the VIH minimum input level) to bridge the undefined region of the falling edge of SCL. (3) The maximum tHDDAT has only to be met if the device does not stretch the Low period (tLOW) of the SCL signal. (4) A Fast mode I2C bus device can be used in a Standard mode I2C bus system, but the requirement that tSUDAT be 250 ns (minimum) must then be met. For the DIX4192-Q1, this condition is automatically the case, because the device does not stretch the Low period of the SCL signal. (5) CB is defined as the total capacitance of one bus line in picofarads (pF). If mixed with High-Speed mode devices, faster fall times are allowed. HOST INTERFACE: SPI MODE fCCLK Serial clock (CCLK) frequency 0 40 MHz tCSCR CS falling to CCLK rising 8 ns tCFCS CCLK falling to CS rising 7 ns tCDS CDIN data set-up time 7 ns tCDH CDIN data hold time 6 ns tCFDO CCLK falling to CDOUT data valid 3 ns tCSZ CS rising to CDOUT high-impedance 3 ns HOST INTERFACE: I2C STANDARD MODE(1) fSCL SCL clock frequency 0 100 kHz tHDSTA Hold time repeated START condition 4 μs tLOW Low period of SCL clock 4.7 μs tHIGH High period of SCL clock 4 μs tSUSTA Set-up time repeated START condition 4.7 μs tHDDAT Data hold time 0(2) 3.45(3) μs tSUDAT Data set-up time 250 ns tR Rise time for both SDA and SDL 1000 ns tF Fall time for both SDA and SDL 300 ns tSUSTO Set-up time for STOP condition 4 μs tBUF Bus free time between START and STOP 4.7 μs CB Capacitive load for each bus line 400 pF VNL Noise margin at low level (including hysteresis) 0.1 × VIO V VNH Noise margin at high level (including hysteresis) 0.2 × VIO V HOST INTERFACE: I2C FAST MODE(1) fSCL SCL clock frequency 0 400 kHz tHDSTA Hold time repeated START condition 0.6 μs tLOW Low period of SCL clock 1.3 μs tHIGH High period of SCL clock 0.6 μs tSUSTA Set-up time repeated START condition 0.6 μs tHDDAT Data hold time 0(2) 0.9(3) μs tSUDAT Data set-up time 100(4) ns tR Rise time for both SDA and SDL 20 + 0.2CB (5) 300 ns tF Fall time for both SDA and SDL 20 + 0.2CB (5) 300 ns tSUSTO Set-up time for STOP condition 0.6 μs tBUF Bus free time between START and STOP 1.3 μs tSP Spike pulse duration suppressed by input filter 0 50 ns CB Capacitive load for each bus Line 400 pF VNL Noise margin at low level (including hysteresis) 0.1 × VIO V VNH Noise margin at high level (including hysteresis) 0.2 × VIO V |
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