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STM32G030C8T6 데이터시트(PDF) 59 Page - STMicroelectronics

부품명 STM32G030C8T6
상세설명  Arm® Cortex®-M0 32-bit MCU, up to 64 KB Flash, 8 KB RAM, 2x USART, timers, ADC, comm. I/Fs, 2.0-3.6V
PDF  94 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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STM32G030C8T6 데이터시트(HTML) 59 Page - STMicroelectronics

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DS12991 Rev 1
59/94
STM32G030x6/x8
Electrical characteristics
80
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
•
A supply overvoltage is applied to each power supply pin.
•
A current is injected to each input, output and configurable I/O pin.
These tests are compliant with EIA/JESD 78A IC latch-up standard.
5.3.13
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDDIO1 (for standard, 3.3 V-capable I/O pins) should be avoided during normal
product operation. However, in order to give an indication of the robustness of the
microcontroller in cases when abnormal injection accidentally happens, susceptibility tests
are performed on a sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out-of-range parameter: ADC error above a certain limit
(higher than 5 LSB TUE), induced leakage current on adjacent pins out of conventional
limits (-5 µA/+0 µA range) or other functional failure (for example reset occurrence or
oscillator frequency deviation).
Negative induced leakage current is caused by negative injection and positive induced
leakage current is caused by positive injection.
Table 46. Electrical sensitivity
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +85 °C conforming to JESD78
II Level A
Table 47. I/O current injection susceptibility(1)
1. Based on characterization results, not tested in production.
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current
on pin
All except PA1, PA3, PA5,
PA6, PA13, PB0, PB1, PB2,
and PB8
-5
N/A
mA
PA1, PA5, PA13, PB1, PB2
0
+5 / N/A(2)
2. The injection current value is applicable when the switchable diode is activated, N/A when not activated.
PA3, PA6, PB0
-5
+5 / N/A(2)
PB8
0
N/A



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