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ADS5400IPZP 데이터시트(PDF) 6 Page - Texas Instruments

부품명 ADS5400IPZP
상세설명  ADS5400 12-Bit, 1-GSPS Analog-to-Digital Converter
PDF  58 Pages
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ADS5400IPZP 데이터시트(HTML) 6 Page - Texas Instruments

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ADS5400
SLAS611C – OCTOBER 2009 – REVISED JANUARY 2016
www.ti.com
Pin Functions (continued)
PIN
TYPE
DESCRIPTION
NO.
NAME
Unidirectional serial interface data in 4-pin mode (reg 0x01) provides internal register
80
SDO
Output
settings. The SDO pin is in high-impedance state in 3-pin interface mode (default).
Analog input common mode voltage, Output (for DC-coupled applications, nominally 2.5
89
VCM
Input/Output
V). A 0.1-
μF capacitor to AGND is recommended, but not required.
Reference voltage input (2 V nominal). A 0.1-
μF capacitor to AGND is recommended,
87
VREF
Input
but not required.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
AVDD5 to GND
6
V
AVDD3 to GND
5
V
DVDD3 to GND
5
V
Supply
AINP, AINN to GND(2)
Voltage difference between pin and ground
0.5
4.5
V
voltage
(AVDD5 +
Short duration
–0.3
V
0.3)
Voltage difference
AINP to AINN(2)
between pins, common
Continuous AC signal
1.25
3.75
V
mode at AVDD5/2
Continuous DC signal
1.75
3.25
V
CLKINP, CLKINN to GND(2)
Voltage difference between pin and ground
0.5
4.5
V
Voltage difference
Continuous AC signal
1.1
3.9
V
CLKINP to CLKINN(2)
between pins, common
Continuous DC signal
2
3
V
mode at AVDD5/2
RESETP, RESETN to
(AVDD5 +
Voltage difference between pin and ground
–0.3
V
GND(2)
0.3)
Continuous AC signal
1.1
3.9
V
Voltage difference
Pin voltage
RESETP to RESETN(2)
between pins
Continuous DC signal
2
3
V
Data/OVR Outputs to
(DVDD3 +
–0.3
GND(2)
0.3)
SDENB, SDIO, SCLK to
(AVDD3 +
Voltage difference between pin and ground
–0.3
V
GND(2)
0.3)
ENA1BUS, ENPWD,
(AVDD5 +
–0.3
ENEXTREF to GND(2)
0.3)
Operating
–40
85
°C
Temperature
Maximum junction , TJ
150
°C
Storage, Tstg
–65
150
°C
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied. Kirkendall voidings and current density information for calculation of expected lifetime is available upon
request.
(2)
Valid when supplies are within recommended operating range.
6.2 ESD Ratings
VALUE
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
2000
Electrostatic
V(ESD)
V
discharge
Charged device model (CDM), per JEDEC specification JESD22-C101(2)
500
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6
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