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ADS5521 데이터시트(PDF) 3 Page - Texas Instruments

부품명 ADS5521
상세설명  14-Bit, 125Msps ANALOG-TO-DIGITAL CONVERTER
PDF  37 Pages
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제조업체  TI2 [Texas Instruments]
홈페이지  https://www.ti.com
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ADS5521 데이터시트(HTML) 3 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS
ADS5500
SBAS303F – DECEMBER 2003 – REVISED FEBRUARY 2007
RECOMMENDED OPERATING CONDITIONS (continued)
MIN
NOM
MAX
UNIT
Clock duty cycle (see Figure 49 for more information)
50%
0
70
Open free-air temperature range
°C
–40
85
Typ values given at T
A = 25°C, min and max specified over the full recommended operating temperature range, AVDD =
DRV
DD = 3.3 V, sampling rate = 125 Msps, 50% clock duty cycle, DLL On, 3-VPP differential clock, and –1-dBFS differential
input, unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
14
Bits
ANALOG INPUTS
Differential input range
2.3
VPP
Differential input impedance
See Figure 41
6.6
Ω
Differential input capacitance
See Figure 41
4
pF
Analog input common-mode current (per
300
µA
input)
Analog input bandwidth
Source impedance = 50
Ω
750
MHz
Clock
Voltage overload recovery time
4
Cycles
INTERNAL REFERENCE VOLTAGES
VREFM
Reference bottom voltage
0.97
V
VREFP
Reference top voltage
2.11
V
Reference error
– 4%
±0.9%
4%
VCM
Common-mode voltage output
1.55
±0.05
V
DYNAMIC DC CHARACTERISTICS AND ACCURACY
No missing codes
Tested
DNL
Differential linearity error
fIN = 10 MHz
–0.9
±0.75
1.1
LSB
INL
Integral linearity error
fIN = 10 MHz
–5
±2.5
5
LSB
Offset error
–11
±1.5
11
mV
Offset temperature coefficient 0.02
mV/
°C
∆offset error/∆AV
DD from AVDD = 3
DC power supply rejection ratio, DC PSRR
0.25
mV/V
V to AVDD = 3.6 V
Gain error (1)
–2
±0.45
2
%FS
Gain temperature coefficient
0.01
∆%/°C
DYNAMIC AC CHARACTERISTICS
25
°C to T
MAX
71.5
73.2
fIN = 10 MHz
Full temp range
70.5
72.8
fIN = 30 MHz
72.7
fIN = 55 MHz
71.9
SNR
Signal-to-noise ratio
25
°C to T
MAX
70.8
72.3
dBFS
fIN = 70 MHz
Full temp range
69.8
72
fIN = 100 MHz
71.2
fIN = 150 MHz
70.1
fIN = 225 MHz
69.1
RMS output noise
Input tied to common-mode
1.1
LSB
(1)
Gain error is specified by design and characterization; it is not tested in production.
3
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