MB85R256F

DS501-00011-9v1-E

11



ESD AND LATCH-UP

• Current method of Latch-Up Resistance Test

Note : The voltage VIN is increased gradually and the current IIN of 300 mA at maximum shall flow.

Confirm the latch up does not occur under IIN   300 mA.

In case the specific requirement is specified for I/O and IIN cannot be 300 mA, the voltage shall be

increased to the level that meets the specific requirement.

Test

DUT

Value

ESD HBM (Human Body Model)

JESD22-A114 compliant

MB85R256FPFCN-G-BNDE1



|2000 V|

ESD MM (Machine Model)

JESD22-A115 compliant



|200 V|

ESD CDM (Charged Device Model)

JESD22-C101 compliant



|1000 V|

Latch-Up (I-test)

JESD78 compliant



Latch-Up (Vsupply overvoltage test)

JESD78 compliant



Latch-Up (Current Method)

Proprietary method



|300 mA|

Latch-Up (C-V Method)

Proprietary method



A

VDD

VSS

DUT

V

IIN

VIN

+

-

Test terminal

Protection Resistor

VDD

(Max.Rating)

Reference

terminal