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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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BQ40Z50-R1 데이터시트(PDF) 10 Page - Texas Instruments |
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BQ40Z50-R1 데이터시트(HTML) 10 Page - Texas Instruments |
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10 / 56 page  bq40z50-R1 SLUSCB3 – JULY 2015 www.ti.com Electrical Characteristics: Current Wake Comparator (continued) Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Time from application of tWAKE 700 µs current to wake interrupt Wake comparator tWAKE(SU) 500 1000 µs startup time 7.10 Electrical Characteristics: VC1, VC2, VC3, VC4, BAT, PACK Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VC1–VSS, VC2–VC1, VC3–VC2, VC4–VC3 0.1980 0.2000 0.2020 K Scaling factor BAT–VSS, PACK–VSS 0.049 0.050 0.051 — VREF2 0.490 0.500 0.510 VC1–VSS, VC2–VC1, VC3–VC2, VC4–VC3 –0.2 5 VIN Input voltage range V BAT–VSS, PACK–VSS –0.2 20 VC1, VC2, VC3, VC4, cell balancing off, cell detach ILKG Input leakage current 1 µA detection off, ADC multiplexer off Internal cell balance RCB RDS(ON) for internal FET switch at 2 V < VDS < 4 V 200 Ω resistance Internal cell detach ICD VCx > VSS + 0.8 V 30 50 70 µA check current 7.11 Electrical Characteristics: SMBD, SMBC Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH Input voltage high SMBC, SMBD, VREG = 1.8 V 1.3 V VIL Input voltage low SMBC, SMBD, VREG = 1.8 V 0.8 V VOL Output low voltage SMBC, SMBD, VREG = 1.8 V, IOL = 1.5 mA 0.4 V CIN Input capacitance 5 pF ILKG Input leakage current 1 µA RPD Pulldown resistance 0.7 1.0 1.3 M Ω 7.12 Electrical Characteristics: PRES, BTP_INT, DISP Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC = 2.2 V to 26 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH High-level input 1.3 V VIL Low-level input 0.55 V VBAT > 5.5 V, IOH = –0 µA 3.5 VOH Output voltage high V VBAT > 5.5 V, IOH = –10 µA 1.8 VOL Output voltage low IOL = 1.5 mA 0.4 V CIN Input capacitance 5 pF ILKG Input leakage current 1 µA Output reverse RO Between PRES or BTP_INT or DISP and PBI 8 k Ω resistance 10 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Product Folder Links: bq40z50-R1 |
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