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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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L9965TS 데이터시트(PDF) 50 Page - STMicroelectronics |
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L9965TS 데이터시트(HTML) 50 Page - STMicroelectronics |
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50 / 62 page  5.12.3.1 Diagnostic functions Table 51. NVM cyclic check diagnostic functions Fault type Assertion condition IC reaction to assertion Release condition Maskable NVM Trimming Cyclic check fail At least one of the trimming sectors has failed the cyclic CRC check • TRIM_CYC_CRC_FAIL = 1 in GEN_STATUS1 Clear on read • Check disabled by GENERAL_REG.CYC_CRC_DIS = 1 NVM Configuration Cyclic check fail At least one of the configuration sectors has failed the cyclic CRC check • CONF_CYC_CRC_FAIL = 1 in GEN_STATUS1 Clear on read • Check disabled by GENERAL_REG.CYC_CRC_DIS = 1 5.12.3.2 Electrical parameters Table 52. Configuration integrity check characteristics Symbol Parameter Test conditions Min Typ Max Unit tCONF_CRC Configuration integrity check period Tested by SCAN 25 30 ms L9965T/L9965TS Functional description DS14987 - Rev 1 page 50/62 |
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