| 전자부품 데이터시트 검색엔진 |
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ISO7641FMDWR.B 데이터시트(PDF) 20 Page - Texas Instruments |
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ISO7641FMDWR.B 데이터시트(HTML) 20 Page - Texas Instruments |
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20 / 40 page ![]() IN OUT GND2 GND1 C NOTE A L S1 VCC1 VCC2 C = 0.1 F ±1% m C = 0.1 F ±1% m Pass/Fail Criterion – the output must remain stable. V or V OH OL VTEST V O OUT NOTE A CL VI IN = V CC 0 V t fs fs low VO VI 2.7 V 50% V CC V CC V OL V OH ISO7640FM, ISO7641FM SLLSE89G – SEPTEMBER 2011 – REVISED JANUARY 2015 www.ti.com Parameter Measurement Information (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 11. Fail-Safe Delay Time Test Circuit and Voltage Waveforms A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 12. Common-Mode Transient Immunity Test Circuit 20 Submit Documentation Feedback Copyright © 2011–2015, Texas Instruments Incorporated Product Folder Links: ISO7640FM ISO7641FM |
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