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DP83867IRPAPR 데이터시트(PDF) 13 Page - Texas Instruments |
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DP83867IRPAPR 데이터시트(HTML) 13 Page - Texas Instruments |
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13 / 139 page ![]() 6.5 Electrical Characteristics (continued) The electrical ratings specified in this section apply to all specifications in this document, unless otherwise noted. These specifications are interpreted as conditions that do not degrade the device parametric or functional specifications for the life of the product containing the device. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT POWER CONSUMPTION PAP P1000 Power consumption, 2 supplies (1) (2) 530 mW P1000 Power consumption, optional 3rd supply(1) (2) 490 mW IDD25 Supply Current, 2 supplies 141 mA IDD11 125 mA IDDIO (1.8V) 22 mA IDD25 Supply Current, optional 3rd supply 90 mA IDD11 125 mA IDD18 51 mA IDDIO (1.8V) 19 mA RGZ P1000 Power consumption, 2 supplies (1) (2) 495 mW P1000 Power consumption, optional 3rd supply(1) (2) 457 mW IDD25 Supply Current, 2 supplies 137 mA IDD10 108 mA IDDIO (1.8V) 24 mA IDD25 Supply Current, optional 3rd supply 86 mA IDD10 108 mA IDD18 50 mA IDDIO (1.8V) 24 mA (1) Power consumption represents total operational power for 1000BASE-T. (2) See Section 8.3 for details on 2-supply and 3-supply configuration. (3) Specified by production test, characterization, or design. 6.6 Power-Up Timing See Figure 6-1. PARAMETER TEST CONDITIONS (1) MIN NOM MAX UNIT T1 Post power-up stabilization time prior to MDC preamble for register accesses MDIO is pulled high for 32-bit serial management initialization. 200 ms T2 Hardware configuration latch-in time from power up Hardware Configuration Pins are described in Section 7.5.1. 200 ms T3 Hardware configuration pins transition to output drivers 64 ns (1) Specified by production test, characterization, or design. www.ti.com DP83867IR, DP83867CR SNLS484I – FEBRUARY 2015 – REVISED JANUARY 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 13 Product Folder Links: DP83867IR DP83867CR |
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