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CRF2512-FZ-R020ELF 데이터시트(PDF) 2 Page - Bourns Electronic Solutions

부품명 CRF2512-FZ-R020ELF
상세설명  CRF Series - High Power Current Sense Chip Resistor
PDF  5 Pages
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제조업체  BOURNS [Bourns Electronic Solutions]
홈페이지  http://www.bourns.com
Logo BOURNS - Bourns Electronic Solutions

CRF2512-FZ-R020ELF 데이터시트(HTML) 2 Page - Bourns Electronic Solutions

  CRF2512-FZ-R020ELF Datasheet HTML 1Page - Bourns Electronic Solutions CRF2512-FZ-R020ELF Datasheet HTML 2Page - Bourns Electronic Solutions CRF2512-FZ-R020ELF Datasheet HTML 3Page - Bourns Electronic Solutions CRF2512-FZ-R020ELF Datasheet HTML 4Page - Bourns Electronic Solutions CRF2512-FZ-R020ELF Datasheet HTML 5Page - Bourns Electronic Solutions  
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3312 - 2 mm SMD Trimming Potentiometer
CRF Series - High Power Current Sense Chip Resistor
Specifications are subject to change without notice.
Users should verify actual device performance in their specific applications.
The products described herein and this document are subject to specific legal disclaimers as set forth on the last page of this document, and at www.bourns.com/docs/legal/disclaimer.pdf.
Performance Characteristics
Test
Conditions
Specification
Reference
Limit
Temperature Coefficient of
Resistance
+25 ~ 125 ℃
IEC 60115-1 4.8
Refer to TCR
Short Time Overload
5x Rated Power for 5 Seconds
IEC 60115-1 4.13
ΔR < ±0.5 %
Low Temperature Storage
-55 °C for 1000 Hours
IEC 60115-1-4.23.4
JIS-C5201-4.23.4
ΔR < ±1 %
High Temperature Exposure
1000 Hours @ +170 ˚C
AEC-Q200-REV E-Test 3
MIL-STD202 Method 108
ΔR < ±1 %
Temperature Cycling
1000 Cycles (-55 ℃ to +155 ℃)
AEC-Q200-REV E-Test 4
JESD22 Method JA-104
ΔR < ±0.5 %
Bias Humidity
+ 85 °C, 85 % RH,
10 % Bias, 1000 Hours
AEC-Q200-REV E-Test 7
MIL-STD-202 Method 103
ΔR < ±1 %
Mechanical Shock
100 g for 6 ms, Half Sine Shock
Pulse
AEC-Q200-REV E-Test 13
MIL-STD-202 Method 213
ΔR < ±0.5 %
Vibration
5 g for 20 Min, 10-2 kHz
12 Cycles
AEC-Q200-REV E-Test 14
MIL-STD-202 Method 204
ΔR < ±0.5 %
Load Life
1000 Hours at Rated Power at
+70 ˚C, 1.5 Hours On, 0.5 Hours
Off
AEC-Q200-REV E-Test 8
MIL-STD-202 Method 108
ΔR < ±1 %
Resistance to Solder Heat
+260 ±5 ˚C, 10±1 Second Dwell
AEC-Q200-REV E-Test 15
MIL-STD-202 Method 210
ΔR < ±0.5 %
ESD
Human body model, 500 V
AEC-Q200-REV E-Test 17
AEC-Q200-002
ISO/DIS 10605
ΔR < ±0.5 %
Solderability
235 ±3 °C Dipping
Time: 3±0.5 Seconds
AEC-Q200-REV E-Test 18
J-STD-002
>95 % Tin Coverage
Board Flex (SMD)
2 mm deflection for 60 Sec.
AEC-Q200-REV E-Test 21
AEC-Q200-005
ΔR < ±0.5 %
Shear (SMD)
Force of 1.8 kg for 60 Sec.
AEC-Q200-REV E-Test 22
AEC-Q200-006
ΔR < ±0.5 %
Resistance Value Codes
Code
R Value (Ω)
Code
R Value (Ω)
Code
R Value (Ω)
Code
R Value (Ω)
L500
0.0005
R004
0.004
R011
0.011
R022
0.022
L750
0.0008
R005
0.005
R012
0.012
R025
0.025
R001
0.001
R006
0.006
R014
0.014
R030
0.03
1L50
0.0015
R007
0.007
R015
0.015
R033
0.033
R002
0.002
R008
0.008
R016
0.016
R035
0.035
R003
0.003
R009
0.009
R018
0.018
R040
0.04
3L50
0.0035
R010
0.01
R020
0.02
R050
0.05
This table lists common resistance values. For resistance values not shown, please contact Bourns Customer Service/Inside Sales.



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