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TUSB212 데이터시트(PDF) 3 Page - Texas Instruments

부품명 TUSB212
상세설명  TUSB212 USB 2.0 High Speed Signal Conditioner
PDF  27 Pages
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제조업체  TI2 [Texas Instruments]
홈페이지  https://www.ti.com
Logo TI2 - Texas Instruments

TUSB212 데이터시트(HTML) 3 Page - Texas Instruments

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4
SDA
3
5
6
9
10
11
12
1
8
7
SCL/CD
RSTN
EQ
D2P
D2M
DC_BOOST/
ENA_HS
GND
VREG
VCC
D1M
D1P
2
3
TUSB212
www.ti.com
SLLSEX5A – AUGUST 2017 – REVISED SEPTEMBER 2017
Product Folder Links: TUSB212
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
(1)
Pull-up resistors for SDA and SCL pins in I2C mode should be 4.7 kΩ (5%). If both SDA and SCL are pulled up at reset the device
enters into I2C mode.
(2)
Pull-down and pull-up (to 3.3 V) resistors for DC_BOOST pins must be between 22 kΩ to 47 kΩ in non I2C mode.
5 Pin Configuration and Functions
RWB Package
12 Pin (X2QFN)
Top View
Pin Functions
PIN
I/O
INTERNAL
PULLUP/PULLDOWN
DESCRIPTION
NAME
NO.
D1M
1
I/O
N/A
USB High Speed negative port..
D1P
2
I/O
N/A
USB High Speed positive port.
SDA
(1)
3
I/O
RSTN asserted: 500 k
Ω PD
I2C Mode:
Bidirectional I2C data pin [I2C address = 0x2C].
In non I2C mode:
Reserved for TI test purpose.
SCL
(1)/CD
4
I/O
RSTN asserted: 500 k
Ω PD
In I2C mode:
I2C clock pin [I2C address = 0x2C].
Non I2C mode:
After reset: Output CD. Flag indicating that a USB device is attached (connection
detected). Asserted from an unconnected state upon detection of DP or DM pull-up
resistor. De-asserted upon detection of disconnect.
RSTN
5
I
500 k
Ω PU
Device disable/enable.
Low – Device is at reset and in shutdown, and
High – Normal operation.
Recommend 0.1-µF external capacitor to GND to ensure clean power on reset if not
driven.
If the pin is driven, it must be held low until the supply voltage for the device reaches
within specifications.
EQ
6
I
N/A
USB High Speed AC boost select via external pull down resistor.
Sampled upon de-assertion of RSTN. Does not recognize real time adjustments.
Auto selects max AC Boost when left floating.
D2P
7
I/O
N/A
USB High Speed positive port.
D2M
8
I/O
N/A
USB High Speed negative port.
DC_BOOST
(2)/
ENA_HS
9
I/O
In I2C mode:
Reserved for TI test purpose.
In non-I2C mode:
At reset: 3-level input signal DC_BOOST. USB High Speed DC signal boost selection.
H (pin is pulled high) – 80 mV
M (pin is left floating) – 60 mV
L (pin is pulled low) – 40 mV
After reset: Output signal ENA_HS. Flag indicating that channel is in High Speed mode.
Asserted upon:
1. Detection of USB-IF High Speed test fixture from an unconnected state followed by
transmission of USB TEST_PACKET pattern.
2. Squelch detection following USB reset with a successful HS handshake [HS
handshake is declared to be successful after single chirp J chirp K pair where each chirp
is within 18 μs – 128 μs].
GND
10
P
N/A
Ground
VREG
11
O
N/A
1.8-V LDO output. Only enabled when operating in High Speed mode. Requires 0.1-µF
external capacitor to GND to stabilize the core.
VCC
12
P
N/A
Supply power



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