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CC2560BYFVT 데이터시트(PDF) 39 Page - Texas Instruments

부품명 CC2560BYFVT
상세설명  CC256x Dual-Mode Bluetooth® Controller
PDF  54 Pages
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제조업체  TI2 [Texas Instruments]
홈페이지  https://www.ti.com
Logo TI2 - Texas Instruments

CC2560BYFVT 데이터시트(HTML) 39 Page - Texas Instruments

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CC2560A NRND; CC2564 NRND
39
CC2560A, CC2560B, CC2564, CC2564B
www.ti.com
SWRS121E – JULY 2012 – REVISED JANUARY 2016
Submit Documentation Feedback
Product Folder Links: CC2560A CC2560B CC2564 CC2564B
Device and Documentation Support
Copyright © 2012–2016, Texas Instruments Incorporated
8.4
Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community
TI's
Engineer-to-Engineer
(E2E)
Community.
Created
to
foster
collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge,
explore ideas and help solve problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help
developers get started with Embedded Processors from Texas Instruments and to foster
innovation and growth of general knowledge about the hardware and software surrounding
these devices.
8.5
Trademarks
MSP430, DRP, E2E are trademarks of Texas Instruments.
Cortex, ARM7TDMIE are registered trademarks of ARM Limited.
ARM is a registered trademark of ARM Physical IP, Inc.
iPod is a registered trademark of Apple, Inc.
Dual-Mode Bluetooth are registered trademarks of Bluetooth SIG, Inc.
All other trademarks are the property of their respective owners.
8.6
Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
8.7
Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.



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