M27W400 datasheet(4/15 Pages) STMICROELECTRONICS

4 / 15 page

M27W400

4/15

The M27W400 has two control functions, both of

which must be logically active in order to obtain

data at the outputs. In addition the Word-wide or

Byte-

wide

organisation

must

selected.

Chip Enable (E) is the power control and should be

used for device selection. Output Enable (G) is the

output control and should be used to gate data to

the output pins independent of device selection.

Assuming that the addresses are stable, the ad-

dress access time (tAVQV) is equal to the delay

from E to output (tELQV). Data is available at the

output after a delay of tGLQV from the falling edge

of G, assuming that E has been low and the ad-

dresses have been stable for at least tAVQV-tGLQV.

Standby Mode

The M27W400 has a standby mode which reduc-

es the supply current from 20mA to 15µA. The

M27W400 is placed in the standby mode by apply-

ing a CMOS high signal to the E input. When in the

standby mode, the outputs are in a high imped-

ance state, independent of the G input.

Table 5. AC Measurement Conditions

High Speed

Standard

Input Rise and Fall Times

≤ 10ns

≤ 20ns

Input Pulse Voltages

0 to 3V

0.4V to 2.4V

Input and Output Timing Ref. Voltages

1.5V

0.8V and 2V

Figure 3. Testing Input Output Waveform

AI01822

High Speed

1.5V

2.4V

Standard

0.4V

2.0V

0.8V

Figure 4. AC Testing Load Circuit

AI01823B

1.3V

OUT

CL = 30pF for High Speed

CL = 100pF for Standard

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz)

Note: 1. Sampled only, not 100% tested.

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance (except BYTEVPP)VIN = 0V

Input Capacitance (BYTEVPP)VIN = 0V

120

COUT

Output Capacitance

VOUT = 0V

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