TLC271, TLC271A, TLC271B

Document number: DS35395 Rev. 1 - 0

41 of 51

www.diodes.com

November 2014

© Diodes Incorporated

TLC271, TLC271A, TLC271B

Application Information (cont.)

Parameter measurement circuits

Because the TLC271 is optimized for single-supply operation, circuit configurations used for the various tests can present some difficulties

since the input signal must be offset from ground. This issue can be avoided by testing the device with split supplies and the output load tied

to the negative rail. Example circuits are shown below.

(a) Single Supply

(b) Split Supply

+

+

-

CL

RL

VDD

VI

VO

+

-

CL

RL

VDD

VI

VO

+

VDD-

Figure 92 Measurement circuit with either single or split supply

+

(a) Single Supply

(b) Split Supply

+

-

CL

RL

VDD

VO

+

-

CL

RL

VDD

VO

+

VDD-

½ VDD

2 k

Ω

20

Ω

20

Ω

2 k

Ω

20

Ω

20

Ω

Fig 93 Noise measurement with single or split supply

+

(a) Single Supply

(b) Split Supply

+

-

CL

VDD

VO

+

-

CL

VDD

VO

+

VDD-

½ VDD

10 k

Ω

100

Ω

10 k

Ω

VI

100

Ω

VI

Figure 94 Gain of 100 with single or split supply