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M29F002 데이터시트(PDF) 13 Page - STMicroelectronics

부품명 M29F002
상세설명  2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory
PDF  29 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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M29F002 데이터시트(HTML) 13 Page - STMicroelectronics

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background image
Symbol
Alt
Parameter
Test Condition
M29F002T / M29F002NT / M29F002B
Unit
-70
-90
-120
VCC =5V
± 10% VCC =5V ± 10% VCC =5V ± 10%
Standard
Interface
Standard
Interface
Standard
Interface
Min
Max
Min
Max
Min
Max
tAVAV
tRC
Address Valid to
Next Address Valid
E=VIL,G = VIL
70
90
120
ns
tAVQV
tACC
Address Valid to
Output Valid
E=VIL,G = VIL
70
90
120
ns
tELQX
(1)
tLZ
Chip Enable Low to
Output Transition
G= VIL
00
0
ns
tELQV
(2)
tCE
Chip Enable Low to
Output Valid
G= VIL
70
90
120
ns
tGLQX
(1)
tOLZ
Output Enable Low
to Output Transition
E= VIL
00
0
ns
tGLQV
(2)
tOE
Output Enable Low
to Output Valid
E= VIL
30
35
50
ns
tEHQX
tOH
Chip Enable High to
Output Transition
G= VIL
00
0
ns
tEHQZ
(1)
tHZ
Chip Enable High to
Output Hi-Z
G= VIL
20
20
30
ns
tGHQX
tOH
Output Enable High
to Output Transition
E= VIL
00
0
ns
tGHQZ
(1)
tDF
Output Enable High
to Output Hi-Z
E= VIL
20
20
30
ns
tAXQX
tOH
Address Transition
to Output Transition
E=VIL,G = VIL
00
0
ns
tPLEL
(1,3)
tREADY
RPNC Low to Read
Mode
10
10
10
µs
tPHEL
tRSP
RPNC High to Chip
Enable Low
50
50
50
ns
tPLPX
tRP
RPNC Pulse Width
500
500
500
ns
Notes: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV -tGLQV after the falling edge of E without increasing tELQV.
3. To be considered only if the Reset pulse is given while the memory is in Erase mode.
Table 14. Read AC Characteristics
(TA = 0 to 70
°C or –40 to 85°C)
13/29
M29F002T, M29F002NT, M29F002B



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